The art of making the surface speak... by TOF-SIMS

The TOF-SIMS technique allows to characterize the surface and extreme surface chemical composition of a sample.


Mass Spectrum

The TOF-SIMS technique is able to provide mass spectral information.

Ion image

The TOF-SIMS technique allows to obtain images of surface elements and molecules.

Depth profiling

Profiling allows targeting of small areas and also depth of investigation profiles without selecting specific features of interest. Also, clustered ion beams allow profiling of organic materials while retaining structurally significant information.

Why the TOF-SIMS technique?

  • Analysis of failures and root causes in case of delamination, blistering, corrosion...
  • Optimization of assembly by gluing
  • Observation of deposits or pollution on the surface (elementary diagnosis of the surface)
  • Verification of the surface functionalization of a product (improvement of its performance: adhesion, mechanical clinging...)

Would you like more information ?
Please, contact us !

As an independent analytical chemistry laboratory with a team of experienced doctors and engineers, FILAB guarantees the reliability of your results, ensures rapid processing of requests and provides personalized support to its customers.

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Parc Mazen Sully  13, rue Pauline Kergomard
BP 37460  21074 DIJON CEDEX – FRANCE
Tél. +33 (0)3 80 52 32 05